Title :
Measurement of non-elastic asperity compliance of magnetic tapes
Author :
Tan, Sanwu ; Baugh, Eric ; Talke, Frank E.
Author_Institution :
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
Cyclic loading and unloading is applied to investigate elastic and non-elastic effects of asperity compliance of magnetic tapes. Multi-wavelength ellipsometry is used to measure the optical constants of the magnetic tapes needed in the calculation of the contact spacing. The magnetic tapes investigated are found to be optically anisotropic along different directions. Plastic deformation of highest asperities is observed during the first load cycle. The effects of tape surface roughness on asperity compliance is investigated by analyzing the statistics of the highest asperities
Keywords :
elastic constants; ellipsometry; magnetic tapes; optical constants; plastic deformation; surface topography; asperity compliance; contact spacing; cyclic loading; elastic effects; first load cycle; magnetic tapes; multi-wavelength ellipsometry; nonelastic asperity compliance; nonelastic effects; optical constants; plastic deformation; tape surface roughness; unloading; Anisotropic magnetoresistance; Ellipsometry; Geometrical optics; Magnetic analysis; Magnetic anisotropy; Magnetoelasticity; Perpendicular magnetic anisotropy; Plastics; Rough surfaces; Surface roughness;
Journal_Title :
Magnetics, IEEE Transactions on
