DocumentCode :
1414372
Title :
Environment Exposure Tests of Electron-Emitting Film for Spacecraft Charging Mitigation
Author :
Khan, Arifur R. ; Sumida, Takahiro ; Iwata, Minoru ; Toyoda, Kazuhiro ; Cho, Mengu ; Fujita, Tatsuhito
Author_Institution :
Lab. of Spacecraft Environ. Interaction Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
Volume :
40
Issue :
2
fYear :
2012
Firstpage :
380
Lastpage :
387
Abstract :
A new electron-emitting device operating in completely passive manner has been developed to prevent spacecraft charging and discharging. It is named as electron-emitting film (ELF) for spacecraft charging mitigation. This emitter (ELF) utilizes the field enhancement at the triple junction formed at the interface where metal and insulator are met and exposed to vacuum. ELF emits prebreakdown emission current that might lead to arcing at the triple junction. Hence, it balances the input and output currents to the spacecraft during substorm. After ensuring the robustness of this ELF against ground handling and in-orbit contamination, laboratory experiment confirmed continuous electron emission for 100 accumulated hours to assure the endurance. In this paper, its durability against high-energy electron and proton irradiation equivalent to ten solar years in GEO is reported. Effect of heat cycling (-150 °C-100 °C) and vacuum ultraviolet irradiation in GEO on this emitter is also completed. Postemissions of this ELF confirm the durability under those harsh space environments.
Keywords :
electron emission; space vehicles; surface charging; durability; electron emission; electron-emitting device; electron-emitting film; environment exposure tests; high-energy electron irradiation; proton irradiation; spacecraft charging mitigation; vacuum ultraviolet irradiation; Discharges; Electric potential; Geophysical measurement techniques; Ground penetrating radar; Junctions; Radiation effects; Space vehicles; Electron beam; electron emission; thin-film device; ultraviolet radiation effect;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2011.2179565
Filename :
6122065
Link To Document :
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