Title :
Adaptive Testing: Dealing with Process Variability
Author_Institution :
Aptina, San Jose, CA, USA
Abstract :
This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.
Keywords :
integrated circuit design; integrated circuit manufacture; integrated circuit testing; IC testing; adaptive testing; integrated circuits; manufacturing process variation; Adaptation models; Integrated circuit reliability; Integrated circuit testing; Manufacturing processes; Mathematical model; Real time systems; design and test; real-time analysis; statistical data analysis; test flow; variability;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.118
