Title :
On the diagnostic properties of linear feedback shift registers
Author :
Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
10/1/1991 12:00:00 AM
Abstract :
The authors study the relation between the length of the linear feedback shift register (LFSR), the size of the circuit (which defines the size of the fault list), and the quality of diagnostic resolution. They present an analytical model that is used to obtain a simple formula determining the fraction of faults that are uniquely diagnosed for a given circuit size and the LFSR length. The model is verified through extensive experiments on benchmark circuits
Keywords :
fault location; feedback; logic testing; probability; shift registers; BIST; analytical model; circuit size; diagnostic properties; diagnostic resolution; fault list size; linear feedback shift registers; register length; Analytical models; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Compaction; Fault diagnosis; Linear feedback shift registers; Shift registers; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
