DocumentCode
14170
Title
Fabrication of High-Resolution
X-Ray Scintillator by Physical Vapor Deposition
Author
Marton, Zsolt ; Bhandari, Harish B. ; Brecher, Charles ; Miller, Stuart R. ; Singh, Bawa ; Nagarkar, Vivek V.
Author_Institution
Radiat. Monitoring Devices, Inc., Watertown, MA, USA
Volume
60
Issue
2
fYear
2013
fDate
Apr-13
Firstpage
983
Lastpage
987
Abstract
A new structured scintillator was developed that will stop significantly more of the incident X-rays without sacrificing spatial resolution. We have recently demonstrated that it is possible to deposit Lu2O3:Eu in a microcolumnar form using electron beam (e-beam) physical vapor deposition (EBPVD) technique. This new structured Lu2O3:Eu scintillator can have a huge impact on X-ray imaging applications including medical imaging, nondestructive testing and hard X-ray microtomography (XMT). Thin film fabrication of Lu2O3 doped with 5% europium was carried out by means of EBPVD. Uniform and stoichiometrically balanced films several microns thick were grown on various kinds of substrates. Their morphology was studied by scanning electron microscopy (SEM) and X-ray diffraction (XRD). Scintillation decay, afterglow, spatial resolution and light conversion efficiency were analyzed. A selected set of films was integrated into position-sensitive detection systems to determine their efficacy for synchrotron and laboratory X-ray source-based high-resolution microtomography.
Keywords
X-ray detection; X-ray diffraction; X-ray imaging; electron beam deposition; europium; lutetium compounds; nondestructive testing; position sensitive particle detectors; scanning electron microscopy; solid scintillation detectors; stoichiometry; thin film devices; thin films; EBPVD; Lu2O3:Eu; X-ray diffraction; X-ray imaging applications; X-ray source-based high-resolution microtomography; X-rays scintillator; afterglow; electron beam; europium doping; film morphology; light conversion efficiency; medical imaging; microcolumnar form; nondestructive testing; physical vapor deposition; position-sensitive detection systems; scanning electron microscopy; scintillation decay; spatial resolution; stoichiometrically balanced films; thin film fabrication; Chemical vapor deposition; Photonics; Spatial resolution; Substrates; X-ray imaging; Electron-beam evaporation; hard X-ray micro tomography; high attenuation; microstructured scintillator; spatial resolution; thin film;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2232939
Filename
6413256
Link To Document