• DocumentCode
    1417167
  • Title

    A 14-bit 100-Msample/s subranging ADC

  • Author

    Moreland, Carl ; Murden, Frank ; Elliott, Michael ; Young, Joe ; Hensley, Mike ; Stop, Russell

  • Author_Institution
    Analog Devices, Greensboro, NC, USA
  • Volume
    35
  • Issue
    12
  • fYear
    2000
  • Firstpage
    1791
  • Lastpage
    1798
  • Abstract
    This paper describes a 14-b analog-to-digital converter designed in a complementary bipolar process. Although it uses a fairly traditional three-stage subranging architecture, several nontraditional techniques are incorporated to achieve 14 bits of performance at a clock rate of 100 MHz. For linearity, the most critical of these is wafer level trimming of the first subrange digital-to-analog converter. Prototype silicon exhibits a spurious-free dynamic range of 90 dB through the Nyquist frequency and a signal-to noise ratio of 74 dB while dissipating 1.25 W.
  • Keywords
    analogue-digital conversion; bipolar integrated circuits; sample and hold circuits; 1.25 W; 100 MHz; 14 bit; Nyquist frequency; complementary bipolar process; signal-to noise ratio; spurious-free dynamic range; subranging ADC; three-stage subranging architecture; wafer level trimming; Analog-digital conversion; Bandwidth; Circuits; Clocks; Digital-analog conversion; Dynamic range; Error correction; Linearity; Prototypes; Silicon;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.890292
  • Filename
    890292