DocumentCode :
1417221
Title :
The MOS-depletion-mode-thyristor: a new MOS controlled bipolar power device
Author :
Baliga, B. Jayant ; Chang, H.R.
Author_Institution :
Gen. Electr. Co., Schenectady, NY
Volume :
35
Issue :
12
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
2458
Abstract :
A novel MOS gate-controlled thyristor device is discussed. In these depletion-mode thyristors (DMTs), the depletion region formed by the application of a gate bias across an MOS gate is utilized to divert the current flowing in a thyristor element into a transistor element. This process turns off the device because the transistor element derives its base current from the thyristor element. The DMT offers the following attributes: (1) low forward voltage drop in the on-state at high current densities due to conduction via the thyristor element; (2) high-input-impedance MOS gate control, and (3) equivalent performance for complementary (n- and p-channel) devices. Experimental verification of the operation of the DMT devices has been achieved by the fabrication of 600-V devices using a trench (UMOS) gate technology. The forward conduction current density of the device was measured to be five times higher than that of the insulated-gate bipolar transistor at a forward drop of 1 V. Computer simulation of the forward conduction of the DMT indicates that its performance approaches that of a one-dimensional thyristor. The MOS gate controlled current turn-off under high-voltage DC switching has been demonstrated at current densities in excess of 5000 A/cm2
Keywords :
insulated gate field effect transistors; thyristors; 1 V; 600 V; 600-V devices; DMTs; MOS GTO; MOS controlled bipolar power device; MOS gate controlled current turn-off; MOS gate turnoff thyristor; MOS gate-controlled thyristor device; MOS-depletion-mode-thyristor; UMOS; attributes; complementary devices; depletion-mode thyristors; forward conduction; forward conduction current density; high current densities; high-input-impedance MOS gate control; high-voltage DC switching; low forward voltage drop; one-dimensional thyristor; operation; trench gate technology; Current density; Current measurement; Density measurement; Fabrication; Insulation; Low voltage; MOSFETs; OFDM modulation; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.8903
Filename :
8903
Link To Document :
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