• DocumentCode
    1417331
  • Title

    A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time

  • Author

    Salmani, Hassan ; Tehranipoor, Mohammad ; Plusquellic, Jim

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
  • Volume
    20
  • Issue
    1
  • fYear
    2012
  • Firstpage
    112
  • Lastpage
    125
  • Abstract
    Fabless semiconductor industry and government agencies have raised serious concerns about tampering with inserting hardware Trojans in an integrated circuit supply chain in recent years. Most of the recently proposed Trojan detection methods are based on Trojan activation to observe either a faulty output or measurable abnormality on side-channel signals. Time to activate a hardware Trojan circuit is a major concern from the authentication standpoint. This paper analyzes time to generate a transition in functional Trojans. Transition is modeled by geometric distribution and the number of clock cycles required to generate a transition is estimated. Furthermore, a dummy scan flip-flop insertion procedure is proposed aiming at decreasing transition generation time. The procedure increases transition probabilities of nets beyond a specific threshold. The relation between circuit topology, authentication time, and the threshold is carefully studied. The simulation results on s38417 benchmark circuit demonstrate that, with a negligible area overhead, our proposed method can significantly increase Trojan activity and reduce Trojan activation time.
  • Keywords
    flip-flops; invasive software; logic design; Trojan activation time; clock cycles; fabless semiconductor industry; flip flop insertion procedure; functional Trojans; geometric distribution; hardware Trojan detection; Authentication; Benchmark testing; Clocks; Hardware; Logic gates; Simulation; Trojan horses; Dummy flip-flop insertion; hardware trojan; security; trojan activation time; trojan detection;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2093547
  • Filename
    5678829