Title :
Spherical near-field facility for microwave coupling assessments in the 100 MHz-6 GHz frequency range
Author :
Serafin, Dominique ; Lasserre, Jean-Louis ; Bolomey, Jean-Charles ; Cottard, Gil ; Garreau, Philippe ; Lucas, Frederic ; Therond, Frederic
Author_Institution :
DGA, Centre d´´Etudes de Gramat, France
fDate :
8/1/1998 12:00:00 AM
Abstract :
This paper describes a spherical near-field facility set up at the Centre d´Etudes de Gramat (CEG) to perform low-power microwave coupling assessments. Specifically, this facility has been designed to determine the coupling cross section of a complex object. However, it can also be used for the characterization of any radiating system in electromagnetic compatibility (EMC) or high-power microwave (HPM) environments. The near-field approach is shown to be complementary and to offer increased flexibility when compared to other more conventional measurement techniques. More particularly, the use of a probe array in the upper part of the frequency band significantly speeds up the near-field measurement process. Consequently, broadband and multiparameter acquisitions can be performed within acceptable duration. The examples given in this paper provide a broad illustration of the capabilities of near-field techniques for EMC and HPM applications
Keywords :
UHF measurement; electric field measurement; electromagnetic compatibility; magnetic field measurement; microwave measurement; test facilities; 100 MHz to 6 GHz; Centre d´Etudes de Gramat; EMC; SHF; UHF; broadband acquisition; complex object; coupling cross section; electromagnetic compatibility; frequency band; frequency range; high-power microwave environment; low-power microwave coupling assessments; multiparameter acquisition; near-field approach; near-field measurement; probe array; radiating system; spherical near-field facility; Antenna measurements; Carbon capture and storage; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic measurements; Frequency; Impedance; Noise measurement; Numerical models; Testing;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on