DocumentCode :
141914
Title :
Robust design and experimental demonstrations of carbon nanotube digital circuits
Author :
Hills, Gage ; Shulaker, Max ; Hai Wei ; Hong-Yu Chen ; Wong, H.-S Philip ; Mitra, Subhasish
Author_Institution :
Dept. Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2014
fDate :
15-17 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Carbon nanotube field-effect transistors (CNFETs) are excellent candidates for building highly energy-efficient digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections and variations that pose major obstacles to the design of robust and very-large-scale CNFET digital systems. This paper presents an overview of imperfection-immune design and robust CNT processing techniques that enabled the demonstration of the first programmable microprocessor built using CNTs. We also present an overview of a systematic methodology that selects effective combinations of CNT processing options and CNFET circuit design techniques to overcome CNT variations.
Keywords :
carbon nanotube field effect transistors; carbon nanotubes; integrated circuit design; CNFET circuit design techniques; CNT processing options; CNT processing techniques; CNT variations; carbon nanotube digital circuits; carbon nanotube field-effect transistors; imperfection-immune design; programmable microprocessor; very-large-scale CNFET digital systems; CNTFETs; Delays; Digital systems; Electric breakdown; Fabrication; Layout; Substrates; Carbon Nanotube Imperfections; Carbon Nanotube Variations; Carbon Nanotubes; Delay Variations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2014.6946036
Filename :
6946036
Link To Document :
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