DocumentCode
142105
Title
Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology
Author
Hsin-Chieh Chen ; Wei-Chung Chen ; Ying-Wei Chou ; Meng-Wei Chien ; Chin-Long Wey ; Ke-Horng Chen ; Ying-Hsi Lin ; Tsung-Yen Tsai ; Chao-Cheng Lee
Author_Institution
Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2014
fDate
15-17 Sept. 2014
Firstpage
1
Lastpage
4
Abstract
Conventional constant-on-time (COT) control for DC-DC buck converter is apt to be affected by the noise caused by parasitic effect including not properly specified and temperature dependent equivalent series resistance (ESR) and equivalent series inductance (ESL). As a result, the safety operation area (SOA) of the COT is limited by the selection of external components. In this paper, the calibrated anti-ESL (CAESL) technique and the calibrated gain and BW (CGB) technique for alleviating ESL and ESR variation, respectively, are proposed to ensure a robust COT control. Furthermore, degraded output regulation caused by enlarged ESL effect due to input battery voltage variation is also solved by the CAESL technique. The proposed COT converter fabricated in 28nm CMOS technology uses an output capacitor with an ESR smaller than 1mΩ, output ripple of 20mV, and high efficiency higher than 95%. The CAESL circuit can tolerate ESL voltage variation from 0 to 50mV even when operation temperature varies from -40 to 120°C.
Keywords
CMOS integrated circuits; DC-DC power convertors; inductance; CAESL technique; CGB technique; CMOS technology; COT control; DC-DC buck converter; SOA; anti-ESL/ESR variation; calibrated anti-ESL; calibrated gain and BW technique; constant-on-time control; equivalent series inductance; equivalent series resistance; parasitic effect; safety operation area; size 28 nm; Batteries; Calibration; Capacitors; Inductors; Semiconductor optical amplifiers; Voltage control; Voltage-controlled oscillators; calibrated anti-ESL (CAESL); calibrated gain and BW (CGB); equivalent series inductor (ESL); equivalent series resistance (ESR);
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2014.6946134
Filename
6946134
Link To Document