DocumentCode :
142210
Title :
A novel robust digital image watermarking algorithm based on two-level DCT
Author :
Hu Guan ; Zhi Zeng ; Jie Liu ; Shuwu Zhang
Author_Institution :
Inst. of Autom., Beijing, China
Volume :
3
fYear :
2014
fDate :
26-28 April 2014
Firstpage :
1804
Lastpage :
1809
Abstract :
In this paper, we propose a novel blind digital image watermarking algorithm which is resilient to many kinds of image processing attacks and geometric distortions. To embed the watermark, we first map the original watermark to another spread one aiming to fit for the image size and then embed it into the image two-level DCT coefficients we selected using a specified rule. We extract the watermark using two-level DCT accordingly with the help of the correlation scheme. Comparing with other achievements, our proposed schemes, including spread spectrum watermark generation, block-number-fixed image segmentation, two-level DCT and the feature vector extraction rule, play an important role in improving the watermark robustness. Experimental results demonstrate that our method can not only resist common image processing attacks, but also geometric distortions, such as scaling, aspect ratio changing, flip, rotation, and some kinds of combined transforms.
Keywords :
blind source separation; correlation methods; discrete cosine transforms; feature extraction; image coding; image segmentation; image watermarking; security of data; aspect ratio changing; blind digital image watermarking algorithm; block-number-fixed image segmentation; correlation scheme; feature vector extraction rule; flip; geometric distortion; image processing attacks; image rotation; image scaling; image size; image two-level DCT coefficient; robust digital image watermarking algorithm; spread spectrum watermark generation; watermark embedding; watermark extraction; watermark robustness; Discrete cosine transforms; Feature extraction; Indexes; Resists; Robustness; Vectors; Watermarking; Discrete Cosine Transformation; digital image watermarking; invisibility; robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
Conference_Location :
Sapporo
Print_ISBN :
978-1-4799-3196-5
Type :
conf
DOI :
10.1109/InfoSEEE.2014.6946233
Filename :
6946233
Link To Document :
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