Title :
Maximum likelihood estimator for jitter noise models [HF sampling scopes]
Author :
Vandersteen, Gerd ; Pintelon, Rik
Author_Institution :
IMEC, Leuven, Belgium
fDate :
12/1/2000 12:00:00 AM
Abstract :
High-frequency sampling scopes suffer from both additive noise and time jitter. The classical techniques for identifying the additive noise and time jitter noise are based on linear least squares (LS) estimators. This work derives a maximum likelihood (ML) estimator and compares its performance with the LS estimator. Simulation results show the gain in efficiency of the proposed method
Keywords :
jitter; maximum likelihood estimation; measurement errors; noise; oscilloscopes; signal sampling; HF sampling scope; ML estimator; additive noise; high-frequency sampling scopes; jitter noise models; maximum likelihood estimator; Additive noise; Equations; Least squares approximation; Maximum likelihood estimation; Measurement errors; Measurement standards; Noise measurement; Sampling methods; Time measurement; Timing jitter;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
