Title :
BaBar DIRC electronics front-end chain
Author :
Bailly, P. ; Beigbeder, C. ; Bernier, R. ; Breton, D. ; Bonneaud, G. ; Caceres, T. ; Chase, R. ; Chauveau, J. ; Buono, L. Del ; Dohou, F. ; Ducorps, A. ; Gastaldi, F. ; Genat, J.F. ; Hrisoho, A. ; Imbert, P. ; Lebbolo, H. ; Matricon, P. ; Oxoby, G. ; Rena
Author_Institution :
Lab. de Phys. Nucl. et de Hautes Energies, Paris VI Univ., France
fDate :
8/1/1998 12:00:00 AM
Abstract :
The Front-End electronics of the Detector of Internally Reflected Cerenkov light (DIRC) for the BaBar experiment is presented. Its aim is to measure to better than 1 ns the arrival time of Cerenkov photoelectrons, detected in a 11000 phototubes array and their amplitude spectra. It mainly comprises 64-channel DIRC Front-End Boards (DFB) equipped with eight full-custom analog chips performing zero-cross discrimination with 2 mV threshold and pulse shaping, four full-custom digital TDC chips for timing measurements with and a readout logic selecting hits in the trigger window, and DIRC Crate Controller cards (DCC) serializing the data collected from up to 16 DFBs onto a 1.2 Gb/s optical link. Extensive test results of the pre-production chips are presented, as well as system tests
Keywords :
Cherenkov counters; analogue integrated circuits; application specific integrated circuits; discriminators; nuclear electronics; optical links; pulse shaping circuits; BaBar DIRC electronics front-end chain; BaBar experiment; Cerenkov photoelectrons; Detector of Internally Reflected Cerenkov light; crate controller cards; full-custom analog chips; full-custom digital TDC chips; readout logic selecting hits; zero-cross discrimination; Logic; Performance evaluation; Photoelectricity; Pulse measurements; Pulse shaping methods; Semiconductor device measurement; Shape control; System testing; Time measurement; Timing;
Journal_Title :
Nuclear Science, IEEE Transactions on
