مرکز منطقه ای اطلاع رساني علوم و فناوري - Single-insertion temperature testing of semiconductor ICs

DocumentCode :

1424613

Title :

Single-insertion temperature testing of semiconductor ICs

Author :

Pfahnl, A.C.

Author_Institution :

Teradyne, Inc.

Volume :

Issue :

fYear :

2000

fDate :

10/1/2000 12:00:00 AM

Firstpage :

236

Lastpage :

236

Keywords :

Application specific integrated circuits; Circuit testing; Integrated circuit testing; Microcontrollers; Performance analysis; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing; Semiconductor devices; Temperature;

fLanguage :

English

Journal_Title :

Electronics Packaging Manufacturing, IEEE Transactions on

Publisher :

ieee

ISSN :

1521-334X

Type :

jour

DOI :

10.1109/TEPM.2000.895058

Filename :

895058

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1424613