• DocumentCode
    1424698
  • Title

    Logic Restructuring Using Node Addition and Removal

  • Author

    Chen, Yung-Chih ; Wang, Chun-Yao

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • Volume
    31
  • Issue
    2
  • fYear
    2012
  • Firstpage
    260
  • Lastpage
    270
  • Abstract
    This paper presents a logic restructuring technique named node addition and removal (NAR). It works by adding a node into a circuit to replace an existing node and then removing the replaced node. Previous node-merging techniques focus on replacing one node with an existing node in a circuit, but fail to replace a node that has no substitute node. To enhance the node-merging techniques on logic restructuring and optimization, we propose an NAR approach in this paper. We first present two sufficient conditions that state the requirements of added nodes for safely replacing a target node. Then, an NAR approach is proposed to quickly detect the added nodes by performing logic implications based on these conditions. We apply the NAR approach to circuit minimization together with two techniques: redundancy removal and mandatory assignment reuse. We also apply it to satisfiability (SAT)-based bounded sequential equivalence checking (BSEC) to reduce the computation complexity of SAT solving. The experimental results show that our approach can enhance our prior automatic test pattern generation-based node-merging approach. Additionally, our approach has a competitive capability of circuit minimization with 44 times speedup compared to a SAT-based node-merging approach. For BSEC, our approach can work together with other optimization technique to save a total of approximately 39-h verification time for all the benchmarks.
  • Keywords
    circuit optimisation; logic design; logic testing; logic restructuring technique; node addition; node merging technique; node removal; optimization technique; satisfiability based bounded sequential equivalence checking; time 39 h; verification time; Benchmark testing; Circuit faults; Logic gates; Merging; Optimization; Redundancy; Wires; Logic implication; node addition and removal; node merging; observability don´t care;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2011.2167327
  • Filename
    6132646