Beam Pattern Measurements of Millimeter-Wave Kinetic Inductance Detector Camera With Direct Machined Silicon Lens Array

Author

Nitta, Tom ; Naruse, Masato ; Sekimoto, Yutaro ; Mitsui, Kazuki ; Okada, Norio ; Karatsu, Kenichi ; Sekine, Masakazu ; Matsuo, Hiroshi ; Noguchi, Takashi ; Uzawa, Y. ; Seta, Masumichi ; Nakai, Naomasa

Author_Institution

Inst. of Phys., Univ. of Tsukuba, Tsukuba, Japan

Volume

3

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

56

Lastpage

62

Abstract

We have developed 220 and 440-GHz cameras using microwave kinetic inductance detectors (MKIDs) for astronomical observations. The optical system of the MKID camera is based on double-slot antennas and extended hemispherical silicon lens arrays. The lens diameter is three times the target wavelength. The 220-GHz camera and the 440-GHz camera have 9 pixels and 102 pixels, respectively. The silicon lens array has been directly machined using a high-speed spindle on an ultra-precision machine. The shape fabrication error and the surface roughness of the top of the lens were typically less than 10 μm (peak-to-valley) and about 0.7 μm (rms), respectively. The beam patterns of the MKID camera were measured and are in good agreement with the calculations.

Keywords

antenna radiation patterns; astronomical observatories; elemental semiconductors; inductance measurement; micromachining; millimetre wave antennas; millimetre wave detectors; photographic lenses; sensor arrays; silicon; slot antenna arrays; surface roughness; MKID camera; astronomical observations; beam pattern measurement; direct machined silicon lens array; frequency 220 GHz; frequency 440 GHz; microwave kinetic inductance detector; millimeter wave detector; optical system; shape fabrication error; slot antenna; surface roughness; Antenna measurements; Antennas; Arrays; Cameras; Lenses; Shape; Silicon; Antenna radiation patterns; lenses; radio astronomy; superconducting devices;

fLanguage

English

Journal_Title

Terahertz Science and Technology, IEEE Transactions on

Publisher

ieee

ISSN

2156-342X

Type

jour

DOI

10.1109/TTHZ.2012.2235123

Filename

6413268