DocumentCode :
1428557
Title :
Solving the EFIE at Low Frequencies With a Conditioning That Grows Only Logarithmically With the Number of Unknowns
Author :
Andriulli, Francesco P. ; Tabacco, Anita ; Vecchi, Giuseppe
Author_Institution :
Electron. Dept., Politec. di Torino, Torino, Italy
Volume :
58
Issue :
5
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
1614
Lastpage :
1624
Abstract :
A detailed analysis of the electric field integral equation (EFIE) at low frequencies is presented. The analysis, that is based on the Sobolev space mapping properties of the EFIE, explains the conditioning growth of the majority of currently available quasi-Helmholtz decomposition methods (such as Loop-Tree/Star, Loop-Rearranged Trees, etc.) that cure the EFIE low-frequency breakdown. It is shown that these methods have a conditioning that grows polynomially with the number of unknowns. To solve this problem, in this work we present a quasi-Helmholtz decomposition method that leads to an EFIE whose conditioning grows only logaritmically with the number of unknowns. This result is obtained by properly regularizing both the solenoidal and non-solenoidal part of the EFIE. The regularization is obtained by introducing a new set of loop hierarchical basis functions. Numerical tests are provided to confirm the results obtained by the theory.
Keywords :
Helmholtz equations; electric field integral equations; numerical analysis; EFIE low-frequency breakdown; Sobolev space mapping; electric field integral equation; loop hierarchical basis functions; low frequencies analysis; numerical tests; quasi-Helmholtz decomposition methods; Costs; Differential equations; Electric breakdown; Electromagnetic radiation; Electromagnetic scattering; Frequency; Integral equations; Linear systems; Polynomials; Scattering; Testing; Vectors; Vegetation mapping; Electric field integral equation (EFIE); hierarchical bases; integral equations; numerical methods; preconditioning;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2010.2044325
Filename :
5422620
Link To Document :
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