Title :
Dependence of power loss on lamination thickness in 3% grain-oriented silicon iron
Author :
Sharp, M.R.G. ; Overshott, K.J.
Author_Institution :
University of Wales Institute of Science & Technology, Wolfson Centre for the Technology of Soft Magnetic Materials, Department of Electrical Engineering, Cardiff, UK
fDate :
11/1/1973 12:00:00 AM
Abstract :
Measurements of total power loss and domain-wall spacing have been made on individual grains in polycrystalline specimens of commercial grain-oriented 3% silicon iron. The specimens, initially 0.330 mm in thickness, were reduced in thickness in stages of 0.050 mm to a minimum of approximately 0.100 mm. Analysis of the results shows an optimum sample thickness of between 0.19 mm and 0.25 mm, below which the anomalous losses rise rapidly.
Keywords :
domain walls; iron alloys; laminations; losses; magnetic domains; domain wall spacing; grain oriented silicon iron; lamination thickness; measurements; total power loss;
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
DOI :
10.1049/piee.1973.0298
