• DocumentCode
    1429232
  • Title

    An inverse formulation for the identification of magnetic field profiles in plasma lenses

  • Author

    Corti, Lorenza ; De Magistris, Massimiliano ; Formisano, Alessandro ; Stetter, Michael ; Stowe, Stefan

  • Author_Institution
    Dipt. di Ingegneria Elettrica, Naples Univ., Italy
  • Volume
    34
  • Issue
    5
  • fYear
    1998
  • fDate
    9/1/1998 12:00:00 AM
  • Firstpage
    2897
  • Lastpage
    2900
  • Abstract
    The knowledge and the control of the magnetic field profile is of major importance in the application of plasma discharges as magnetic lenses for charged particle beams, because of the complex dynamics of the plasma. Since conventional field measurements are quite difficult for high current plasma discharges, we propose an inverse formulation for the identification of the field profile directly from the focusing data. The problem is shown to be ill-posed, in general; therefore a regularisation is needed. This is obtained, first, by means of a proper restriction of the observation space; second, by using an overdetermined data set, leading to a pseudo-inversion procedure. The numerical solution is illustrated, showing the procedure to be robust, at least for the practical applications range. In particular it is shown how the proposed method is effective in determining the amount of distortion of the field profile as compared to the reference linear one
  • Keywords
    electrodynamics; identification; inverse problems; magnetic fields; magnetic lenses; particle beams; charged particle beams; complex dynamics; field profile; identification; inverse formulation; magnetic field profiles; observation space; overdetermined data set; plasma discharges; plasma lenses; pseudo-inversion procedure; Current measurement; Inverse problems; Lenses; Magnetic field measurement; Magnetic fields; Particle beams; Plasma applications; Plasma devices; Plasma measurements; Plasma properties;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.717675
  • Filename
    717675