DocumentCode :
1431474
Title :
Modeling, Analysis and Control of Dual-Arm Cluster Tools With Residency Time Constraint and Activity Time Variation Based on Petri Nets
Author :
Wu, Nai Qi ; Zhou, MengChu
Author_Institution :
Dept. of Ind. Eng., Guangdong Univ. of Technol., Guangzhou, China
Volume :
9
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
446
Lastpage :
454
Abstract :
Because of residency time constraints and activity time variation of cluster tools, it is very difficult to operate such integrated semiconductor manufacturing equipment. This paper addresses their real-time operational issues. To characterize their schedulability and achieve the minimum cycle time at their steady-state operation, Petri net (PN) models are developed to describe them, which are very compact, and independent of wafer flow pattern. It is due to the proposed models that scheduling cluster tools is converted into determining robot wait times. A two-level operational architecture is proposed to include an offline periodic schedule and real-time controller. The former determines when a wafer should be placed into a process module for processing, while the latter regulates robot wait times online in order to reduce the effect of activity time variation on wafer sojourn times in process modules. Therefore, the system can adapt to activity time variation. A cluster tool derived as a not-always-schedulable system by the existing methods is shown to be always-schedulable by using the proposed novel method.
Keywords :
Petri nets; electronic products; industrial robots; scheduling; Petri net models; Petri nets; activity time variation; dual-arm cluster tools; integrated semiconductor manufacturing equipment; not-always-schedulable system; real-time controller; real-time operational issues; residency time constraints; robot wait times; schedulability; scheduling cluster tools; wafer flow pattern; wafer sojourn times; Load modeling; Real-time systems; Robots; Schedules; Semiconductor device modeling; System recovery; Time factors; Automated manufacturing system; Petri net (PN); cluster tools; discrete event system; optimization; scheduling; semiconductor fabrication;
fLanguage :
English
Journal_Title :
Automation Science and Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1545-5955
Type :
jour
DOI :
10.1109/TASE.2011.2178023
Filename :
6138879
Link To Document :
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