DocumentCode
143166
Title
A technique to solve issue of Richardson-Lucy deconvolution for analyzing RTN effects on SRAM margin variation
Author
Yamauchi, Hiroyuki ; Somha, Worawit
Author_Institution
Inf. Intell. Syst., Fukuoka Inst. of Technol., Fukuoka, Japan
fYear
2014
fDate
25-28 Feb. 2014
Firstpage
1
Lastpage
4
Abstract
This paper demonstrates the issues of Richardson-Lucy (R-L) deconvolution technique when applying it to analyze the Random Telegraph Noise (RTN) effects on SRAM margin modulation and proposes the techniques to address the issues. Unlike the R-L based deconvolution, the proposed technique successfully circumvents the issue of ringing error thanks to eliminating any operations of differential and division. This effectiveness has been demonstrated for the first time with applying it to a real analysis for the effects of the RTN on the overall SRAM margin variations. It has been shown that the proposed technique can reduce its relative errors of the RTN deconvolution by 1014 and 104 times compared with the cases of the R-L and without segmentation, respectively. This enables to reduce the cdf error of the convolution of the RTN with the Random Dopant Fluctuation (RDF) (i.e., fail-bit-count error) by 10-orders of magnitude of the conventional algorithm.
Keywords
SRAM chips; deconvolution; random noise; reliability; R-L deconvolution technique; RDF; RTN deconvolution; RTN effects; Richardson-Lucy deconvolution technique; SRAM margin modulation; cdf error; fail-bit-count error; random dopant fluctuation; random telegraph noise effects; relative errors; ringing error; Deconvolution; Random telegraph noise; Richardson-Lucydeconvolution; SRAM margin variation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (LASCAS), 2014 IEEE 5th Latin American Symposium on
Conference_Location
Santiago
Print_ISBN
978-1-4799-2506-3
Type
conf
DOI
10.1109/LASCAS.2014.6820250
Filename
6820250
Link To Document