• DocumentCode
    1433372
  • Title

    High static performance GaInAs-GaInAsP SCH MQW 1.5 μm wavelength buried ridge stripe lasers

  • Author

    Kazmierski, Christophe ; Ougazzaden, Abdallah ; Blez, Monique ; Robein, Didier ; Landreau, Jean ; Sermage, Bernard ; Bouley, Jean Claude ; Mircea, A.

  • Author_Institution
    CNET, Lannion, France
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    1794
  • Lastpage
    1797
  • Abstract
    The potential advantages of GaInAs/InP multiquantum well (MQW) structures over bulk material for improving the static properties of buried heterostructure (BH) lasers are demonstrated. Using a highly uniform metalorganic vapor phase epitaxy (MOVPE) growth, an optimized simple separate confinement heterostructure (SCH) MQW layer stack, and the buried ridge stripe (BRS) structure, improved static performances over any bulk or unstrained MQW long wavelength laser were obtained. An extremely low threshold below 2 mA was obtained in short cavity lasers, the threshold current was only 10.6 mA and 110 mW continuous-wave (CW) maximum optical power was observed using 90%/10% reflectivity coatings
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser transitions; semiconductor growth; semiconductor junction lasers; semiconductor quantum wells; vapour phase epitaxial growth; 1.5 micron; 10.6 mA; 110 mW; GaInAs-GaInAsP; III-V semiconductors; MQW layer stack; buried heterostructure; buried ridge stripe lasers; continuous-wave; maximum optical power; metalorganic vapor phase epitaxy; multiquantum well; reflectivity coatings; separate confinement heterostructure; short cavity lasers; static performance; threshold current; Coatings; Epitaxial growth; Epitaxial layers; Indium phosphide; Optical materials; Power lasers; Quantum well devices; Reflectivity; Threshold current; Ultraviolet sources;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.90006
  • Filename
    90006