Title :
Defect-oriented diagnosis for very deep-submicron systems
Author :
Lombardi, Fabrizio ; Metra, Cecilia
Author_Institution :
Northeastern University
Keywords :
Atomic force microscopy; Circuit faults; Circuit testing; Current measurement; Design for testability; Electrical resistance measurement; Fault diagnosis; Logic; Signal analysis; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2001.902817
