DocumentCode :
1441675
Title :
Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs
Author :
Shaneyfelt, M.R. ; Schwank, J.R. ; Witczak, S.C. ; Fleetwood, D.M. ; Pease, R.L. ; Winokur, P.S. ; Riewe, L.C. ; Hash, G.L.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
47
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
2539
Lastpage :
2545
Abstract :
A pre-irradiation elevated-temperature stress is shown to have a significant impact on the radiation response of a linear bipolar circuit. Thermal cycling can lead to part-to-part variability in the radiation response of circuits packaged from the same wafer. In addition, it is demonstrated that a pre-irradiation elevated-temperature stress can significantly impact the enhanced low dose rate sensitivity (ELDRS) of the LM111 voltage comparator. Thermal stress moderates and, in some cases, eliminates ELDRS. The data are consistent with space charge models. These results suggest that there may be a connection between the mechanisms responsible for thermal-stress effects and ELDRS in linear circuits. Implications of these results for hardness assurance testing and mechanisms are discussed
Keywords :
bipolar analogue integrated circuits; comparators (circuits); integrated circuit modelling; integrated circuit reliability; integrated circuit testing; radiation effects; radiation hardening (electronics); thermal stresses; LM111 voltage comparator; enhanced low dose rate sensitivity; hardness assurance testing; linear bipolar ICs; part-to-part variability; pre-irradiation elevated-temperature stress; radiation response; space charge models; thermal cycling; thermal-stress effects; Annealing; CMOS technology; Circuits; Laboratories; Packaging; Positron emission tomography; Space charge; Thermal stresses; US Department of Energy; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.903805
Filename :
903805
Link To Document :
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