• DocumentCode
    1442016
  • Title

    Dielectric Charge Control in Electrostatic MEMS Positioners/Varactors

  • Author

    Blokhina, Elena ; Gorreta, Sergi ; Lopez, David ; Molinero, David ; Feely, Orla ; Pons-Nin, Joan ; Dominguez-Pumar, Manuel

  • Author_Institution
    Sch. of Electr., Electron. & Commun. Eng., Univ. Coll. Dublin, Dublin, Ireland
  • Volume
    21
  • Issue
    3
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    559
  • Lastpage
    573
  • Abstract
    A new dynamical closed-loop method is proposed to control dielectric charging in capacitive microelectromechanical systems (MEMS) positioners/varactors for enhanced reliability and robustness. Instead of adjusting the magnitude of the control voltage to compensate the drift caused by the dielectric charge, the method uses a feedback loop to maintain it at a desired level: the device capacitance is periodically sampled, and bipolar pulses of constant magnitude are applied. Specific models describing the dynamics of charge and a control map are introduced. Validation of the proposed method is accomplished both through discrete-time simulations and with experiments using MEMS devices that suffer from dielectric charging.
  • Keywords
    closed loop systems; electrostatic devices; feedback; micromechanical devices; reliability; robust control; varactors; voltage control; capacitive MEMS positioner-varactor; capacitive microelectromechanical systems positioner-varactor; constant bipolar pulse magnitude; dielectric charge control; drift compensation; dynamical closed-loop method; electrostatic MEMS positioner-varactor; feedback loop; magnitude adjustment; reliability enhancement; robustness enhancement; voltage control; Capacitance; Dielectrics; Electrodes; Electrostatics; Mathematical model; Micromechanical devices; Voltage control; Dielectric charging control; MEMS reliability; microelectromechanical systems (MEMS) control;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2011.2182500
  • Filename
    6146450