DocumentCode :
1446173
Title :
Correspondence
Volume :
48
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
609
Lastpage :
610
Keywords :
Biographies; Educational institutions; Electrical engineering; Equations; Error correction; Hot carrier effects; MOS devices; Physics; Quantization; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2001.906459
Filename :
906459
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1446173
