Novel quantitative MFM technique to study orientation ratio in longitudinal recording media

Author

Yen, E.T. ; Thomson, T. ; Chen, J.-P. ; Richter, H.J. ; Ranjan, R.Y. ; Rauch, G.C.

Author_Institution

Seagate Technol. Inc., Fremont, CA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2330

Lastpage

2332

Abstract

A quantitative MFM technique to determine the magnetic orientation in longitudinal media at the microscopic level is described. The remanent magnetization orientation ratio measured by this MFM technique correlates well with the orientation ratio measured using a VSM. The analysis used to determine the orientation ratio from MFM images is based on the disorder noise model. The experimental results show that orientation is reflected in medium noise and interaction effects, as measured using the delta M technique

Keywords

magnetic force microscopy; magnetic recording noise; remanence; delta M technique; disorder noise model; interaction effects; longitudinal media; longitudinal recording media; magnetic orientation; medium noise; microscopic level; orientation ratio; quantitative MFM technique; remanent magnetization orientation ratio; Magnetic anisotropy; Magnetic force microscopy; Magnetic noise; Magnetic properties; Magnetic recording; Perpendicular magnetic anisotropy; Saturation magnetization; Transfer functions; Transistors; Transmission electron microscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908419

Filename

908419