DocumentCode :
1447521
Title :
Media noise reduction in Co-based longitudinal media with new Co co-precipitated NiP/Al substrate
Author :
Yoshimura, S. ; Djayaprawira, D.D. ; Kong, Tham Kim ; Masuda, Y. ; Shoji, H. ; Takahashi, M.
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume :
36
Issue :
5
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
2363
Lastpage :
2365
Abstract :
To decrease the grain size and grain size distribution in longitudinal media, a small amount of oxygen exposure onto either normal NiP or Co co-precipitated Co-NiP/Al-alloy substrates has been used. The substrate surfaces of both media were dry-etched by RF-plasma prior to oxygen exposure. The exposure of 3.5 L of oxygen onto the normal NiP substrate surface reduces the grain diameter from 10.0 nm to 8.8 nm while maintaining the standard distribution of grain diameter of about 1.4 nm. As a result, the media signal to noise ratio increases by 0.6 dB. By adding 400 ppm of Co into NiP plated substrate and combined with 1.5 L of oxygen exposure, the grain diameter and the standard distribution of grain diameter decrease from 9.2 nm to 8.3 nm. As a result, the media signal to noise ratio increases by 1.0 dB
Keywords :
aluminium; cobalt alloys; grain size; magnetic recording noise; magnetic thin films; nickel compounds; sputter etching; substrates; Al; Co co-precipitated NiP/Al substrate; Co-based longitudinal media; CoCrTaNiPt; Cr; NiP; RF-plasma; dry-etching; grain diameter; grain size; media noise reduction; oxygen exposure; signal to noise ratio; substrate surfaces; Chromium; Coercive force; Crystallography; Grain size; Noise reduction; Oxygen; Signal to noise ratio; Sputtering; Substrates; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.908431
Filename :
908431
Link To Document :
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