DocumentCode :
1449507
Title :
Refractive Index Measurement by Using an Optoelectronic Oscillator
Author :
Nguyen, Lam Duy ; Nakatani, Keitaro ; Journet, Bernard
Author_Institution :
SATIE Lab., ENS Cachan, Cachan, France
Volume :
22
Issue :
12
fYear :
2010
fDate :
6/15/2010 12:00:00 AM
Firstpage :
857
Lastpage :
859
Abstract :
The purpose of this letter is to present a preliminary experiment, showing that an optoelectronic oscillator can be used for measuring refractive index by detecting the change of the oscillation frequency. The uncertainty of the measurement is of about 10-2. However, this value can decrease to 10-3 or less if the mechanic vibrations, the temperature control of liquid, and the long-term stability of the oscillator are improved. Measurements have been performed for acetonitrile, acetone, dioxane, and chloroform at the wavelength of 1535 nm and at 25°C approximately.
Keywords :
integrated optoelectronics; optoelectronic devices; oscillators; refractive index measurement; temperature control; vibrations; acetone; acetonitrile; chloroform; liquid temperature control; long-term stability; mechanic vibrations; optoelectronic oscillator; oscillation frequency; refractive index measurement; temperature 25 degC; wavelength 1353 nm; Free spectral range (FSR); optoelectronic oscillator (OEO); phase noise; refractive index;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2046028
Filename :
5437335
Link To Document :
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