DocumentCode
1450146
Title
Modeling and limits of advanced HT-magnets
Author
Schrefl, Thomas ; Fidler, Josef ; Scholz, Werner
Author_Institution
Inst. of Appl. & Tech. Phys., Wien Univ. of Technol., Austria
Volume
36
Issue
5
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
3394
Lastpage
3398
Abstract
This paper combines microstructural investigations using transmission electron microscopy with micromagnetic finite element simulation of the magnetic domain wall pinning behavior of novel Sm(Co, Fe, Cu, Zr)7, 4-8, 0 permanent magnet materials applicable up to 550°C. A finite element method was used to simulate domain wall pinning in SmCo5/Sm2Co17 based permanent magnets. The finite element model was built-according to the cellular microstructure obtained from TEM investigations. The numerical results show a strong influence of the dimension of the cell boundary phase on the coercive field, which significantly increases with the extension of the 1:5/7-type cell boundary phase. The calculated values of the coercive field are in the range from 1000-2000 kA/m assuming a cell size varying from 80-160 nn. The difference of the magnetocrystalline anisotropy between cell boundary and cell interior phases is determined by the Cu-content of the magnet. Due to the lower Curie temperature of the Cu-containing cell boundary phase high coercive fields are obtained at elevated temperatures (>400°C)
Keywords
cobalt alloys; coercive force; copper alloys; crystal microstructure; ferromagnetic materials; finite element analysis; iron alloys; magnetic anisotropy; magnetic domain walls; permanent magnets; samarium alloys; transmission electron microscopy; zirconium alloys; Cu-content; Curie temperature; Sm(Co,Fe,Cu,Zr) permanent magnet materials; SmCo17; SmCo5; SmCo5/Sm2Co17 based permanent magnets; SmCoFeCuZr; TEM; advanced HT-magnets; cell boundary phase; cell interior phases; cellular microstructure; coercive field; elevated temperatures; high temperature magnets; limits; magnetic domain wall pinning behavior; magnetocrystalline anisotropy; micromagnetic finite element simulation; microstructural investigations; modeling; transmission electron microscopy; Finite element methods; Magnetic anisotropy; Magnetic domain walls; Magnetic force microscopy; Magnetic materials; Micromagnetics; Permanent magnets; Perpendicular magnetic anisotropy; Temperature; Transmission electron microscopy;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.908811
Filename
908811
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