A complexity analysis of sequential ATPG

Author

Marchok, Thomas E. ; El-Maleh, Aiman ; Maly, Wojciech ; Rajski, Janusz

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

15

Issue

11

fYear

1996

fDate

11/1/1996 12:00:00 AM

Firstpage

1409

Lastpage

1423

Abstract

The research reported in this paper has been conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation algorithms, which can lead to extremely long test generation times. The retiming transformation is used to create families of circuits which have the same sequential depth and number and length of cycles, but a significantly different percentage of valid states. It was observed for three different sequential test pattern generators that the increase in complexity of test pattern generation is related to a new circuit attribute, termed density of encoding, and not to the sequential depth or number and length of cycles-i.e., those circuit parameters to which the complexity of test pattern generation has traditionally been attributed

Keywords

automatic testing; integrated circuit testing; logic testing; sequential circuits; ATPG algorithm; automatic test pattern generation; circuit parameters; complexity analysis; cycles; density of encoding; retiming transformation; sequential circuit; sequential depth; valid states; Automatic test pattern generation; Circuit faults; Circuit testing; Costs; Design for testability; Logic testing; Sequential analysis; Sequential circuits; Terminology; Test pattern generators;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.543773

Filename

543773