Title :
Measuring the thickness of thin coatings with radiation backscattering
Author :
Clarke, Eric ; Carlin, J. R. ; Barbour, W. E.
Author_Institution :
Tracerlab, Inc., Boston, Mass.
Abstract :
The backscattering of radiation from radioactive substances now is being used to measure thin coatings. This is a nondestructive process which can be used in production wherever measurement is to be made of a coating which has a different atomic number from the backing material.
Keywords :
Atomic measurements; Backscatter; Coatings; Current measurement; Detectors; Materials; Scattering;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1951.6437200
