• DocumentCode
    1451600
  • Title

    On-chip IDDQ testing in the AE11 fail-stop controller

  • Author

    Böhl, Eberhard ; Lindenkreuz, Thomas ; Meerwein, Matthias

  • Author_Institution
    Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
  • Volume
    15
  • Issue
    4
  • fYear
    1998
  • Firstpage
    57
  • Lastpage
    65
  • Abstract
    Targeted for safety-critical applications, this microcontroller replaces the classic two-controller safety structure with a single controller containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combination of concurrent checking, BIST, and IDDQ testing-and considerably extended the standard cell-based design flow
  • Keywords
    built-in self test; integrated circuit testing; microcontrollers; AE11 fail-stop controller; BIST; IDDQ testing; concurrent checking; microcontroller; on-chip IDDQ testing; online fault detection measures; safety-critical applications; standard cell-based design flow; two-controller safety structure; Application software; Built-in self-test; Circuit faults; Clocks; Fault detection; Logic testing; Pulse width modulation; Safety; Software testing; Temperature control;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.735928
  • Filename
    735928
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1451600