DocumentCode :
1452492
Title :
Integrated transient thermal and mechanical analysis of molded PBGA packages during thermal shock
Author :
Mercado, Lei L. ; Lee, Tien-Yu ; Cook, Jeffrey
Author_Institution :
Interconnect Syst. Lab., Motorola Inc., Tempe, AZ, USA
Volume :
24
Issue :
1
fYear :
2001
fDate :
2/1/2001 12:00:00 AM
Firstpage :
66
Lastpage :
75
Abstract :
During thermal shock, large thermal gradients exist within a molded plastic ball grid array (PBGA) package. The conventional assumption of uniform temperature distribution becomes invalid. In this paper, an integrated thermal-mechanical analysis was performed to evaluate the transient effect of thermal shock. For comparison, an isothermal analysis was also conducted. The computational fluid dynamics (CFD) method was used to obtain the thermal boundary conditions surrounding the package. The heat transfer coefficient obtained through CFD was compared to two analytical solutions. It was found that the analytical values were not acceptable in the time period of interest. Therefore, to obtain the actual maximum die stress, CFD solution has to be used instead of analytical solutions to derive the thermal boundary condition. This boundary condition was then applied to the package and a sequentially coupled heat transfer and thermal stress analysis was performed. The transient analysis has shown that high stresses occur in the die due to thermal shock, which can not be seen under the traditional isothermal assumption. The impact of plastic ball grid array (PBGA) package parameters on transient die stress was also studied, including mold thickness and substrate thickness. The results in this paper could be applied to either wire bond or flip-chip PBGA packages
Keywords :
ball grid arrays; computational fluid dynamics; flip-chip devices; lead bonding; moulding; plastic packaging; thermal analysis; thermal shock; thermal stresses; transient analysis; computational fluid dynamics; flip-chip packages; heat transfer coefficient; integrated thermal-mechanical analysis; isothermal analysis; maximum die stress; mold thickness; molded PBGA packages; sequentially coupled heat transfer; substrate thickness; thermal boundary condition; thermal boundary conditions; thermal gradients; thermal shock; thermal stress analysis; time period; transient mechanical analysis; transient thermal analysis; wire bond packages; Boundary conditions; Computational fluid dynamics; Electric shock; Electronics packaging; Heat transfer; Isothermal processes; Performance analysis; Plastic packaging; Thermal stresses; Transient analysis;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.909627
Filename :
909627
Link To Document :
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