• DocumentCode
    1453315
  • Title

    Spectra of gain, absolute refractive index, and wave-guide confinement factor of strained single quantum-well GaInP laser from spontaneous emission

  • Author

    Wu, Linzhang

  • Author_Institution
    Dept. of Precision Instrum., Tsinghua Univ., Beijing, China
  • Volume
    37
  • Issue
    3
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    456
  • Lastpage
    461
  • Abstract
    Both unamplified and amplified spontaneous emission was measured from a compressively-strained single quantum-well GaInP laser. By using a novel and self-consistent technique briefly described in the text, the data were used to systematically determine the gain-peak energy, quasi-Fermi level separation, intrinsic optical loss, absolute refractive index, and optical waveguide confinement factor and gain, including the dispersion of refractive index for a given current. During this process, there is no need for a knowledge of parameters that are difficult to experimentally check with enough accuracy. Furthermore, the effect of dispersion of the refractive index on the optical waveguide confinement factor is discussed
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; optical losses; quantum well lasers; refractive index; spontaneous emission; superradiance; waveguide lasers; GaInP; absolute refractive index; accuracy; amplified spontaneous emission; compressively-strained single quantum-well GaInP laser; gain-peak energy; intrinsic optical loss; optical waveguide confinement factor; quasi-Fermi level separation; refractive index dispersion; self-consistent technique; spontaneous emission; strained single quantum-well GaInP laser; unamplified spontaneous emission; wave-guide confinement factor; Gain measurement; Optical losses; Optical refraction; Optical variables control; Optical waveguides; Quantum well lasers; Refractive index; Spontaneous emission; Stimulated emission; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.910457
  • Filename
    910457