Title :
Optimal and near-optimal test sequencing algorithms with realistic test models
Author :
Raghavan, Vijaya ; Shakeri, Mojdeh ; Pattipati, Krishna
Author_Institution :
Mathworks Inc., Natick, MA, USA
fDate :
1/1/1999 12:00:00 AM
Abstract :
In this paper, we first present the formulation and solution of the basic test sequencing problem. We then consider generalized test sequencing problems that incorporate various practical features such as precedence constraints and setup operations for tests, multi-outcome tests, modular diagnosis, and rectification. We develop various AO* and information heuristic-based algorithms to solve these practical test sequencing problems. We also discuss the issues involved in implementation of the test sequencing algorithms for solving large problems efficiently, and show that our preprocessing techniques result in considerable speed-ups
Keywords :
fault diagnosis; heuristic programming; optimisation; testing; AO* algorithms; information heuristic-based algorithms; modular diagnosis; multi-outcome tests; near-optimal test sequencing algorithms; precedence constraints; preprocessing techniques; rectification; setup operations; test models; Aerospace electronics; Aircraft; Artificial satellites; Costs; Engines; Fault diagnosis; Heuristic algorithms; Performance evaluation; Software testing; System testing;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/3468.736357