DocumentCode :
1454412
Title :
Characterization of waveguide mounted semiconductor devices
Author :
Mahapatra, S. ; Bakir, Q.H.
Volume :
13
Issue :
6
fYear :
1975
Firstpage :
202
Lastpage :
209
Abstract :
Computer-aided design data for the driving point admittance of the gap of a post in an X-band waveguide mount are provided. A simple method of characterization of the P-I-N diode mounted in the gap is given. The admittance of the mounting structure may significantly affect the performance of these devices. Differential phase-shift obtained in the X-band by a reflection type P-I-N diode phase-shifter is now amenable to theoretical correlation.
Keywords :
admittance; computer-aided design; electronics applications of computers; semiconductor diodes; solid-state microwave devices; waveguide components; PIN diode; X-band; admittance; characterisation; differential phase shift; mounting structure; reflection; waveguide mount;
fLanguage :
English
Journal_Title :
India, IEE-IERE Proceedings -
Publisher :
iet
ISSN :
0018-9146
Type :
jour
DOI :
10.1049/iipi.1975.0062
Filename :
5257932
Link To Document :
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