DocumentCode :
14548
Title :
0.0012 mm2, 8 mw, single-to-differential converter with < 1.1% data cross error and <3.4 ps rms jitter up to 14 gbit/s
Author :
Yong Chen ; Mak, Pui-In ; Li Zhang ; He Qian ; Yan Wang
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Volume :
49
Issue :
11
fYear :
2013
fDate :
May 23 2013
Firstpage :
692
Lastpage :
694
Abstract :
An extremely compact, doubly balancing single-to-differential converter (S2D) for high-speed wireline systems is reported. It incorporates a two-stage topology with `coarse balancing´ in the first stage and `fine balancing´ in the second stage by adopting a compact `positive-feedback active inductor´ that simultaneously boosts the signal bandwidth. Fabricated in 65 nm CMOS, the S2D measures <; 1.1% data cross error and <; 3.4 ps RMS jitter up to a 14 Gbit/s data rate. The die occupies 0.0012 mm2 and consumes 8 mW.
Keywords :
CMOS integrated circuits; convertors; inductors; jitter; CMOS; RMS jitter; S2D; S2D measure; coarse balancing; data cross error; fine balancing; positive feedback active inductor; power 8 mW; single-to-differential converter; size 65 nm; wireline system;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2013.0992
Filename :
6548174
Link To Document :
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