Title :
A new approach for the prediction of the neutron-induced SEU rate
Author :
Vial, C. ; Palau, J.-M. ; Gasiot, J. ; Calvet, M.-C. ; Fourtine, S.
Author_Institution :
Centre d´´Electron. de Montpellier, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fDate :
12/1/1998 12:00:00 AM
Abstract :
A new approach for SEU rate prediction in components submitted to neutron environment is presented. The method aims to take into account the characteristics of the secondary particles in terms of electrical effect. So, in addition to the critical energy/charge criterion generally used until now, two criteria are tentatively proposed : a critical LET and a limited distance in which energy must be deposited. The starting point of each computation is a common neutron-silicon interaction database
Keywords :
neutron effects; charge criterion; critical LET; critical energy; electrical effect; electronic component; energy deposition range; neutron-induced SEU rate; neutron-silicon interaction database; secondary particles; single event upset; Aerospace electronics; Aerospace materials; Aircraft; Atmosphere; Databases; Ionization; Neutrons; Particle tracking; Silicon; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
