Title :
High resolution X-ray imaging using a silicon strip detector
Author :
Beuville, E. ; Cahn, R. ; Cederström, B. ; Danielsson, M. ; Hall, A. ; Hasegawa, B. ; Luo, L. ; Lundqvist, M. ; Nygren, D. ; Oltman, E. ; Walton, J.
Author_Institution :
Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
fDate :
12/1/1998 12:00:00 AM
Abstract :
The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 μm pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging
Keywords :
X-ray detection; application specific integrated circuits; biomedical electronics; biomedical equipment; diagnostic radiography; image resolution; silicon radiation detectors; 100 mum; 7.2 keV; Si; X-ray flux enhancement; edge scans; edge-on silicon strip detectors; focusing device; high resolution X-ray imaging; high-speed low-noise parallel processing ASICs; medical diagnostic imaging; medical instrumentation; minimal threshold; negligible cross talk; noiseless single photon counting; refractive X-ray lens; scanned-slot X-ray imaging system; silicon strip detector; Application specific integrated circuits; Image edge detection; Image resolution; Parallel processing; Silicon; Strips; Transfer functions; X-ray detection; X-ray detectors; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
