Title :
Methods and tools for functional testing of System Integrity Protection Schemes
Author :
Apostolov, Alex ; Vandiver, Benton
Author_Institution :
OMICRON Electron., Los Angeles, CA, USA
fDate :
March 31 2014-April 3 2014
Abstract :
Functional and application testing is the most widely accepted testing practice for protection and control systems and is required to ensure that a System Integrity Protection Scheme (SIPS) and each of its components are going to operate as designed under different system conditions. The paper discusses in detail the requirements for functional testing of devices and distributed functions used in SIPS. The methods for testing of both types of systems are proposed.
Keywords :
power system control; power system protection; power system stability; application testing; distributed functions; functional testing; protection and control systems; system integrity protection schemes; Functional testing; System Integrity Protection Schemes;
Conference_Titel :
Developments in Power System Protection (DPSP 2014), 12th IET International Conference on
Conference_Location :
Copenhagen
Print_ISBN :
978-1-84919-834-9
DOI :
10.1049/cp.2014.0039
