Modeling of conductor loss in coplanar circuit elements by the method of lines

Author

Vietzorreck, Larissa ; Pascher, Wilfrid

Author_Institution

Allgemeine und Theor. Elektrotech., Fern Univ., Hagen, Germany

Volume

45

Issue

12

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

2474

Lastpage

2478

Abstract

The small dimensions of coplanar waveguides (CPW´s) require due consideration of finite conductivity and metallization thickness. For this purpose, an efficient method of lines (MoL) approach for full-wave analysis of microstrip discontinuities is considerably extended. Two alternative models for the conductor loss are employed depending on the skin depth. Their respective region of validity is investigated and the current distribution in the center conductor of a CPW is given. Several cascaded discontinuities including a coplanar quarter-wave transformer and a short-end series stub in a microshield line are characterized

Keywords

MMIC; coplanar waveguides; current distribution; microstrip discontinuities; skin effect; cascaded discontinuities; conductor loss; coplanar circuit elements; coplanar quarter-wave transformer; current distribution; finite conductivity; full-wave analysis; metallization thickness; method of lines; microshield line; microstrip discontinuities; short-end series stub; skin depth; Boundary conditions; Circuits; Conductivity; Conductors; Coplanar waveguides; Metallization; Microstrip; Skin; Strips; Transmission line discontinuities;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.643862

Filename

643862