مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1460189

Title :

ICMTS´96

Volume :

Issue :

fYear :

1997

fDate :

5/1/1997 12:00:00 AM

Keywords :

CMOS integrated circuits; Contamination; Electron mobility; Flash memory; Integrated circuit testing; MOSFETs; Neural networks; Optical scattering; Pollution measurement; Semiconductor process modeling;

fLanguage :

English

Journal_Title :

Semiconductor Manufacturing, IEEE Transactions on

Publisher :

ieee

ISSN :

0894-6507

Type :

jour

DOI :

10.1109/TSM.1997.572065

Filename :

572065

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1460189