Title :
S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties
Author_Institution :
Univ. Politecnica de Cartagena, Murcia, Spain
Abstract :
A broadband technique for determining the electromagnetic properties of isotropic thin-film materials, which uses a coplanar line, is presented. Complex permittivity and permeability are computed from S-parameter measurements of a coplanar cell propagating the dominant mode. Measured /spl epsi//sub /spl tau// and μ/sub /spl tau// data for several materials are presented between 0.05 GHz and 40 GHz. This technique shows a good agreement between measured and predicted data.
Keywords :
S-parameters; coplanar transmission lines; microwave measurement; network analysers; permittivity; 0.05 to 40 GHz; S-parameter broadband measurements; complex permittivity; complex permittivity permeability; coplanar cell; coplanar line; dominant mode; electromagnetic properties; isotropic thin-film materials; substrate intrinsic properties; Conducting materials; Electromagnetic measurements; Equations; Frequency; Impedance; Length measurement; Microstrip; Permeability measurement; Permittivity measurement; Substrates;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.914309
