• DocumentCode
    146129
  • Title

    Impact of discrete dopants on an ultra-scaled FinFET using quantum transport simulations

  • Author

    Valin, Raul ; Martinez, A. ; Aldegunde, Manuel ; Barker, John R.

  • Author_Institution
    Coll. of Eng., Swansea Univ., Swansea, UK
  • fYear
    2014
  • fDate
    22-26 Sept. 2014
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    In this paper we study the effect of random discrete dopants in the source/drain on the performance of a 6.6 nm channel length silicon FinFET. Due to the small dimensions of the FinFET, a quantum transport formalism based on the Non-equilibrium Greens Functions has been deployed. The transfer characteristics for several devices, which differ in location and number of dopants have been simulated. Our calculations demonstrated that discrete dopants modify the effective channel length and the height of the source/drain barrier, consequently changing the channel control of the charge. As a consequence, there is a strong effect on the variability of the off-current, sub-threshold slope and threshold voltage. Finally, we have calculated the mean and standard deviation of these parameters to quantify their variability.
  • Keywords
    Green´s function methods; MOSFET; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; transport processes; Si; discrete dopant impact; nonequilibrium Greens functions; quantum transport simulations; random discrete dopants; semiconductor device variability; size 6.6 nm; source-drain barrier; standard deviation; ultrascaled FinFET; Educational institutions; Electric potential; FinFETs; Green´s function methods; Impurities; Silicon; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference (ESSDERC), 2014 44th European
  • Conference_Location
    Venice
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4799-4378-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2014.6948831
  • Filename
    6948831