Title :
Large area thin film semiconductor detectors using multichannel counting Castor readout chip
Author :
Hordequin, C. ; Foulon, F. ; Dulinski, W. ; Turchetta, R. ; Claus, G. ; Brambilla, A. ; Bergonzo, P.
Author_Institution :
CEA, Centre d´´Etudes Nucleaires de Saclay, Gif-sur-Yvette, France
fDate :
12/1/2000 12:00:00 AM
Abstract :
The performance of charged particle counters associating thin diamond or amorphous silicon (a-Si) detectors to Castor VLSI analog-digital circuits for the fabrication of large area detectors an reported. The 20 μm thick semiconductor detectors were synthesised using chemical vapour deposition (CVD) technique. Detectors of 2.5×2.5 cm2 area were segmented in 32 sub-areas of 13 mm2 in order to limit the electronic noise per reading channel. The 32 channel circuit was used to record the counting rate and the total number of counts on each segment. Such detection systems were tested under alpha particles (241Am) as well as under low energy beta particles (14C). The results show that large area detection systems can readily be fabricated at low cost by the association of an application specific readout chip (ASIC) with chemically vapour deposited semiconductor detectors
Keywords :
CVD coatings; VLSI; alpha-particle detection; beta-ray detection; diamond; digital readout; mixed analogue-digital integrated circuits; nuclear electronics; semiconductor counters; silicon radiation detectors; 2.5 cm; ASIC; C; CVD; Castor VLSI analog-digital circuits; Si; a-Si detectors; alpha particles; application specific readout chip; charged particle counters; chemical vapour deposition; large area thin film semiconductor detectors; low energy beta particles; multichannel counting Castor readout chip; thin diamond detectors; Amorphous silicon; Analog-digital conversion; Chemical vapor deposition; Circuit synthesis; Counting circuits; Detectors; Fabrication; Semiconductor thin films; Thin film circuits; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on