DocumentCode :
1463120
Title :
Time-domain envelope measurement technique with application to wideband power amplifier modeling
Author :
Clark, Christopher J. ; Chrisikos, George ; Muha, Michael S. ; Moulthrop, Andrew A. ; Silva, Christopher P.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Volume :
46
Issue :
12
fYear :
1998
fDate :
12/1/1998 12:00:00 AM
Firstpage :
2531
Lastpage :
2540
Abstract :
This paper presents a new time-domain measurement technique for repetitive microwave signals that is applied to modeling wideband power amplifiers. The measurement technique concept consists of recording the microwave signal after conversion to baseband using a calibrated downconverter, which improves measurement accuracy compared to measurements at the carrier frequency. The modeling section describes how such time-domain measurements can be used to model wideband signal effects in nonlinear power amplifiers. The commonly used memory-less envelope model is limited to use on narrowband signals. A new model is developed which includes a filter before the memory-less nonlinearity to capture the memory effects associated with wideband signals. It is demonstrated that the accuracy of wideband signal simulations can be improved by optimizing the model parameters based on time-domain measurements of wideband signals
Keywords :
microwave frequency convertors; microwave measurement; microwave power amplifiers; time-domain analysis; travelling wave amplifiers; wideband amplifiers; calibrated downconverter; measurement accuracy; memory effects; memory-less envelope model; model parameters; narrowband signals; nonlinear power amplifiers; time-domain envelope measurement technique; wideband power amplifier modeling; Baseband; Broadband amplifiers; Frequency measurement; Measurement techniques; Microwave amplifiers; Microwave measurements; Microwave theory and techniques; Power amplifiers; Time domain analysis; Wideband;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.739245
Filename :
739245
Link To Document :
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