• DocumentCode
    1463692
  • Title

    Limitations and challenges of computer-aided design technology for CMOS VLSI

  • Author

    Bryant, Randal E. ; Cheng, Kwang-Ting ; Kahng, Andrew B. ; Keutzer, Kurt ; Maly, Wojciech ; Newton, Richard ; Pileggi, Lawrence ; Rabaey, Jan M. ; Sangiovanni-Vincentelli, Alberto

  • Author_Institution
    Dept. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    89
  • Issue
    3
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    341
  • Lastpage
    365
  • Abstract
    As manufacturing technology moves toward fundamental limits of silicon CMOS processing, the ability to reap the full potential of available transistors and interconnect is increasingly important. Design technology (DT) is concerned with the automated or semi-automated conception, synthesis, verification, and eventual testing of microelectronic systems. While manufacturing technology faces fundamental limits inherent in physical laws or material properties, design technology faces fundamental limitations inherent in the computational intractability of design optimizations and in the broad and unknown range of potential applications within various design processes. In this paper, we explore limitations to how design technology can enable the implementation of single-chip microelectronic systems that take full advantage of manufacturing technology with respect to such criteria as layout density performance, and power dissipation
  • Keywords
    CMOS digital integrated circuits; VLSI; circuit CAD; circuit layout CAD; circuit optimisation; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; timing; ASIC; CAD technology; CMOS VLSI; DFT; IC design process; Si; Si CMOS ICs; automated synthesis; computer-aided design technology; design optimizations; integrated circuit design process; layout density performance; power dissipation; single-chip microelectronic systems; testing; verification; Automatic testing; CMOS process; CMOS technology; Computer aided manufacturing; Design automation; Manufacturing processes; Material properties; Microelectronics; Silicon; System testing;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.915378
  • Filename
    915378