• DocumentCode
    1464686
  • Title

    Experimental Determination of Quantum and Centroid Capacitance in Arsenide–Antimonide Quantum-Well MOSFETs Incorporating Nonparabolicity Effect

  • Author

    Ali, Ashkar ; Madan, Himanshu ; Misra, Rajiv ; Agrawal, Ashish ; Schiffer, Peter ; Boos, J. Brad ; Bennett, Brian R. ; Datta, Suman

  • Author_Institution
    Pennsylvania State Univ., University Park, PA, USA
  • Volume
    58
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1397
  • Lastpage
    1403
  • Abstract
    Experimental gate capacitance (Cg) versus gate voltage data for InAs0.8Sb0.2 quantum-well MOSFET (QW-MOSFET) is analyzed using a physics-based analytical model to obtain the quantum capacitance (CQ) and centroid capacitance (Ccent). The nonparabolic electronic band structure of the InAs0.8Sb0.2 QW is incorporated in the model. The effective mass extracted from Shubnikov-de Haas magnetotransport measurements is in excellent agreement with that extracted from capacitance measurements. Our analysis confirms that in the operational range of InAs0.8Sb0.2 QW-MOSFETs, quantization and nonparabolicity in the QW enhance CQ and Ccent. Our quantitative model also provides an accurate estimate of the various contributing factors toward Cg scaling in future arsenide-antimonide MOSFETs.
  • Keywords
    MOSFET; arsenic compounds; galvanomagnetic effects; indium compounds; semiconductor device models; semiconductor quantum wells; InAs0.8Sb0.2; QW-MOSFET; Shubnikov-de Haas magnetotransport measurements; arsenide-antimonide quantum-well MOSFET; capacitance measurements; centroid capacitance; experimental gate capacitance; gate voltage; nonparabolic electronic band structure; nonparabolicity effect; physics-based analytical model; quantum capacitance; Capacitance measurement; Effective mass; Integrated circuit modeling; Logic gates; Quantum capacitance; Temperature measurement; Effective mass; InAsSb; high-$kappa$ dielectric; interface states; nonparabolicity; quantum capacitance; split capacitance–voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2110652
  • Filename
    5723732