DocumentCode
1464686
Title
Experimental Determination of Quantum and Centroid Capacitance in Arsenide–Antimonide Quantum-Well MOSFETs Incorporating Nonparabolicity Effect
Author
Ali, Ashkar ; Madan, Himanshu ; Misra, Rajiv ; Agrawal, Ashish ; Schiffer, Peter ; Boos, J. Brad ; Bennett, Brian R. ; Datta, Suman
Author_Institution
Pennsylvania State Univ., University Park, PA, USA
Volume
58
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
1397
Lastpage
1403
Abstract
Experimental gate capacitance (Cg) versus gate voltage data for InAs0.8Sb0.2 quantum-well MOSFET (QW-MOSFET) is analyzed using a physics-based analytical model to obtain the quantum capacitance (CQ) and centroid capacitance (Ccent). The nonparabolic electronic band structure of the InAs0.8Sb0.2 QW is incorporated in the model. The effective mass extracted from Shubnikov-de Haas magnetotransport measurements is in excellent agreement with that extracted from capacitance measurements. Our analysis confirms that in the operational range of InAs0.8Sb0.2 QW-MOSFETs, quantization and nonparabolicity in the QW enhance CQ and Ccent. Our quantitative model also provides an accurate estimate of the various contributing factors toward Cg scaling in future arsenide-antimonide MOSFETs.
Keywords
MOSFET; arsenic compounds; galvanomagnetic effects; indium compounds; semiconductor device models; semiconductor quantum wells; InAs0.8Sb0.2; QW-MOSFET; Shubnikov-de Haas magnetotransport measurements; arsenide-antimonide quantum-well MOSFET; capacitance measurements; centroid capacitance; experimental gate capacitance; gate voltage; nonparabolic electronic band structure; nonparabolicity effect; physics-based analytical model; quantum capacitance; Capacitance measurement; Effective mass; Integrated circuit modeling; Logic gates; Quantum capacitance; Temperature measurement; Effective mass; InAsSb; high-$kappa$ dielectric; interface states; nonparabolicity; quantum capacitance; split capacitance–voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2110652
Filename
5723732
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